Publication | Closed Access
Temperature Influence on Dielectric Tunnel FET Characterization and Subthreshold Characterization
12
Citations
29
References
2022
Year
Electrical EngineeringSemiconductor DeviceEngineeringTunneling MicroscopyNanoelectronicsApplied PhysicsTemperature InfluenceSemiconductor MaterialMicroelectronicsElectrical PropertyElectrical Insulation
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