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Determination of Junction Temperature of GaN-based Light Emitting Diodes by Electroluminescence and Micro-Raman Spectroscopy
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2009
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Unknown Venue
Rise of junction temperature during operation can greatly affect performance and reliability of Light-emitting diodes (LED). Unfortunately, the junction temperature of the LED can not be measured directly. In this report, non-contact methods using Electro-luminescence (EL) and Micro-Raman spectroscopy were employed to estimate the junction temperature of GaN-based LED.