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Investigating the degradation behaviours of n+-doped Poly-Si passivation layers: An outlook on long-term stability and accelerated recovery

Materials EngineeringMaterials ScienceDegradation BehavioursEngineeringBias Temperature InstabilityApplied PhysicsLong-term StabilityAccelerated RecoverySemiconductor Device FabricationSilicon On InsulatorMicroelectronicsOptoelectronicsSemiconductor Device