Publication | Open Access

Model correction and updating of a stochastic degradation model for failure prognostics of miter gates

ReliabilityElectrical EngineeringReliability EngineeringModel CorrectionMiter GatesEngineeringReliability ModellingUncertainty QuantificationHardware ReliabilityComputer EngineeringSystems EngineeringCircuit ReliabilityReliability PredictionStochastic Degradation ModelPhysic Of Failure