High-NA optical edge detection via optimized multilayer films

Abstract

Abstract There has been a significant effort to design nanophotonic structures that process images at the speed of light. A prototypical example is in edge detection, where photonic-crystal-, metasurface-, and plasmon-based designs have been proposed and in some cases experimentally demonstrated. In this work, we show that multilayer optical interference coatings can achieve visible-frequency edge detection in transmission with high numerical aperture, two-dimensional image formation, and straightforward fabrication techniques, unique among all nanophotonic approaches. We show that the conventional Laplacian-based transmission spectrum may not be ideal once the scattering physics of real designs is considered, and show that better performance can be attained with alternative spatial filter functions. Our designs, comprising alternating layers of Si and SiO 2 with total thicknesses of only <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" overflow="scroll"> <mml:mo>≈</mml:mo> <mml:mrow> <mml:mn>1</mml:mn> </mml:mrow> <mml:mtext> </mml:mtext> <mml:mrow> <mml:mi>μ</mml:mi> <mml:mrow> <mml:mtext>m</mml:mtext> </mml:mrow> </mml:mrow> </mml:math> , demonstrate the possibility for optimized multilayer films to achieve state-of-the-art edge detection, and, more broadly, analog optical implementations of linear operators.