Publication | Closed Access
Comparative study by DFT method of structural, electronic and optical properties of monolayer, bilayer and bulk CdS
13
Citations
56
References
2021
Year
Materials ScienceIi-vi SemiconductorEngineeringNanotechnologySurface ScienceApplied PhysicsDft MethodSemiconductor MaterialBulk CdsLayered MaterialComparative StudyCompound Semiconductor
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