Concepedia

Coordinated monitoring and control method of deposited layer width and reinforcement in WAAM process

Yiming Wang, Xingwang Xu, Zhuang Zhao, Wenxiang Deng, Jing Han, Lianfa Bai, Xianglong Liang, Jianyong Yao

Journal of Manufacturing Processes · 2021 · 70 citations · 26 references

DOI

Concepts

References

26

Deep Residual Learning for Image Recognition

Kaiming He, Xiangyu Zhang, Shaoqing Ren et al. · 2016 · 222.1K citations · Full text

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ImageNet classification with deep convolutional neural networks

Alex Krizhevsky, Ilya Sutskever, Geoffrey E. Hinton · Communications of the ACM · 2017 · 75.7K citations · Full text

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Very Deep Convolutional Networks for Large-Scale Image Recognition

Karen Simonyan, Andrew Zisserman · arXiv (Cornell University) · 2014 · 75.5K citations · Full text

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Squeeze-and-Excitation Networks

Jie Hu, Li Shen, Samuel Albanie et al. · IEEE Transactions on Pattern Analysis and Machine Intelligence · 2019 · 12.5K citations

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Non-local Neural Networks

Xiaolong Wang, Ross Girshick, Abhinav Gupta et al. · 2018 · 11.2K citations

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