IEEE Transactions on Knowledge and Data Engineering · 2021 · 36 citations · 44 references
ComputingComputer ScienceFeature EngineeringMachine LearningOptimizationFeature SelectionOptimization For Machine LearningPattern RecognitionRepresentation LearningSelf-supervised LearningSemi-supervised LearningAlternating Direction Method Of MultipliersSemi-supervised Feature LearningSemi-supervised Feature SelectionSemi-supervised ModelsSemi-supervised RegressionSemi-supervised Representation LearningSparse Feature SelectionSpectral Embedding
Semi-supervised feature selection methods jointly exploit the labelled and unlabeled samples when selecting the features. Under the semi-supervised learning scenario, the number of labelled data significantly impacts the feature selection performance. In this paper, we introduce the label learning with binary hashing to the research field of feature selection and propose a novel Semi-supervised Feature Selection with Binary Label Learning (SFS-BLL) model. Specifically, we learn the binary hash codes as the pseudo labels by specially imposing binary hash constraints on the spectral embedding process to increase the number of labels. Meanwhile, we propose a self-weighted sparse regression module which exploits the learned labels and given manual labels together with importance differentiation to guide the feature selection process. Finally, we develop an effective discrete optimization method based on the Alternating Direction Method of Multipliers (ADMM) to iteratively optimize the binary labels and the feature selection matrix. Extensive experiments on widely tested benchmarks demonstrate the superiority of the proposed method from various aspects.
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