Evolution of pronounced ferroelectricity in Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>thin films scaled down to 3 nm

Chin-I Wang, Hsin-Yang Chen, Chun-Yuan Wang, Teng-Jan Chang, Yu‐Sen Jiang, Chih‐Sheng Chang, Miin‐Jang Chen

Journal of Materials Chemistry C · 2021 · 39 citations · 57 references

Concepts

Abstract

Thickness dependent ferroelectric characteristics of HZO are systematically demonstrated down to 3 nm, exhibiting low operation voltage and high endurance.

References

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