New technologies for x-ray microscopy: phase correction and fully automated deep learning based tomographic reconstruction

Abstract

The progress of scientific research and technology development greatly depends upon effective imaging solutions for characterizing the properties and behaviors of materials. Revealing details of microstructure, ideally in 3D, is a critical part of this understanding, whether the goal is to develop and confirm models that describe material properties and behaviors or simply to visualize structural details. ZEISS offers 3D X-ray microscopes (XRM): advanced imaging solutions that have removed major hurdles for three-dimensional imaging by achieving high contrast and submicron resolution imaging even for relatively large samples. These groundbreaking advances in non-destructive, three-dimensional (3D) imaging empower a broad range of technical disciplines.