Publication | Open Access
Structural analysis of sputtered amorphous silica thin films: A Raman spectroscopy investigation
31
Citations
70
References
2021
Year
Materials ScienceMaterial AnalysisEngineeringOptical PropertiesRaman Spectroscopy InvestigationApplied PhysicsStructural AnalysisGlass MaterialThin FilmsAmorphous SolidThin Film Processing
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