Extremely bias stress stable enhancement mode sol–gel-processed SnO2 thin-film transistors with Y2O3 passivation layers - Concepedia

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Extremely bias stress stable enhancement mode sol–gel-processed SnO2 thin-film transistors with Y2O3 passivation layers

31

Citations

44

References

2021

Year

Changmin Lee, Won‐Yong Lee, Do Won Kim, Hyeon Joong Kim, Jin‐Hyuk Bae, In Man Kang, Doohyeok Lim, Kwangeun Kim, Jaewon Jang

Applied Surface Science

Materials ScienceElectrical EngineeringEngineeringY2o3 Passivation LayersOxide ElectronicsApplied PhysicsThin Film Process TechnologyThin FilmsThin Film Processing

References

	Year	Citations

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