Concepedia

Residual stress determination in thin films by X-ray diffraction and the widespread analytical practice applying a biaxial stress model: An outdated oversimplification?

Peter Schoderböck, Harald Köstenbauer

Applied Surface Science · 2020 · 19 citations · 32 references

DOI

Concepts

References

32

The Elastic Behaviour of a Crystalline Aggregate

R. Hill · Proceedings of the Physical Society Section A · 1952 · 11.2K citations

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<i>TOPAS</i> and <i>TOPAS-Academic</i>: an optimization program integrating computer algebra and crystallographic objects written in C++

Alan A. Coelho · Journal of Applied Crystallography · 2018 · 2.4K citations

, , +15

<i>R</i> factors in Rietveld analysis: How good is good enough?

Brian H. Toby · Powder Diffraction · 2006 · 1.4K citations · Full text

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Review Article: Stress in thin films and coatings: Current status, challenges, and prospects

G. Abadias, Eric Chason, Jozef Kečkéš et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2018 · 820 citations · Full text

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Fundamental parameters line profile fitting in laboratory diffractometers

R. W. Cheary, Alan A. Coelho, James P. Cline · Journal of Research of the National Institute of Standards and Technology · 2004 · 639 citations · Full text

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