Surface plasmon microscopy

Eric M. Yeatman, E.A. Ash

Electronics Letters · 1987 · 176 citations · 1 references

Concepts

Abstract

The use of surface plasmon resonance measurements for the imaging of surfaces has been investigated. Images of dielectric patterns deposited on silver films are presented, with thickness sensitivity of about 3 Å and a lateral resolution of about 25μm.

References

1