Advances of Modeling and Reduction of Conducted and Radiated EMI in Flyback Converters

Abstract

Recent years have witnessed evolutions of topologies and applications of wide bandgap devices in flyback converters, in order to improve efficiency and power density. However, due to the increased topology diversity, and the increased high frequency noise, unprecedented EMI challenges are created. Those challenges lead to advances of EMI modeling and reduction techniques, to be generalized for different topologies, and to be effective at higher frequency ranges. The emerging flyback EMI challenges and research advances are analyzed in this paper. Future challenges and development of EMI in flyback converters are discussed.