Publication | Closed Access
Determining the refractive index and the dielectric constant of PPDT2FBT thin film using spectroscopic ellipsometry
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Citations
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References
2020
Year
Materials ScienceIi-vi SemiconductorSpectroscopic PropertyOptical MaterialsDielectric ConstantEngineeringOptical PropertiesOptical TestingApplied PhysicsThin Film Process TechnologyThin FilmsOptoelectronicsRefractive IndexThin Film ProcessingPpdt2fbt Thin Film
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