An Optimized Dielectric-Metal-Dielectric Refractive Index Nanosensor

Abstract

In this article, a nanoscale refractive index sensor with double rectangular silver slots perpendicularly coupled with a pair of horizontal dielectric-metal-dielectric (DMD) waveguides is proposed. The simulation of the transmission spectra, deploying the finite integration scheme, shows a linear relationship with the refractive index. Parameters of the suggested sensor have been thoroughly optimized to upgrade its sensing competency. The results achieve a maximum sensitivity of 1228.67 nm/RIU and a high resolution of 8.72×10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-7</sup> RIU, making the schematic an attractive option for commercial and research purposes. Additionally, the capability of the nanosensor as a temperature detector is tested and found to be operable for a freezing point as low as -100° C. Also, the device has undergone simulations of undesirable manufacturing defects, which can occur in real-time and has demonstrated a high degree of tolerance. The presented sensor, therefore, can be treated as a notable solution for on-chip gadgets with all these numerous features and shows promise for future development in the plasmonic refractive index sensor domain.