ACS Applied Nano Materials · 2020 · 81 citations · 58 references
EngineeringElectrical EngineeringMaterials ScienceNanomaterialsNanotechnologySemiconductor DevicesNanoelectronicsPhotodetectorsSemiconductor DetectorsSemiconductor Device MaterialsSemiconductor NanomaterialsUltraviolet DetectorsExternal Quantum EfficiencyMolecular Beam EpitaxyNanoparticlesNoise Equivalent PowerOptoelectronic PropertiesPhotodetectionQuantum EfficiencyUltraviolet Photodetectors
Vertically aligned GaN nanotowers (NTs) were grown on the Si (111) substrate by plasma-assisted molecular beam epitaxy to design a highly responsive ultraviolet (UV) photodetector. The UV detector fabricated on a bare GaN-NT array yielded highly sensitive and repeatable device characteristics attributed by high responsivity (R), low noise equivalent power (NEP), and a high external quantum efficiency (EQE) of 484.77 A/W, 1.76 × 10–13 W.Hz-1/2, and 1.85 × 105 %, respectively. Furthermore, the developed UV photodetector demonstrated fast response with excellent stability when functionalized with Au nanoparticles and ZnO nanorods. This hybridized GaN-NT-based device with ZnO nanorods and Au nanoparticles significantly accelerated the performance of the device where a prominent three-order reduction under dark current is observed along with gigantic R, lower NEP, and an extremely enhanced EQE of 7042 A/W, 1.84 × 10–14 W.Hz-1/2, and 2.7 × 106%, respectively. The mechanism elaborating the enhanced device performance with a localized surface plasmon effect has been discussed through an energy band diagram. The fabricated highly sensitive device can lead the path toward future optoelectronic applications of integrated III-nitride technology.
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The physics and chemistry of the Schottky barrier height
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X-ray diffraction of III-nitrides
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