XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time - Concepedia

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Publication | Open Access

XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

DOI Full Paper Access

54

Citations

38

References

2020

Year

Simon Detriche, S. Vivegnis, J.-F. Vanhumbeeck, Alexandre Felten, Pierre Louette, Frank Uwe Renner, J. Delhalle, Zineb Mekhalif

Journal of Electron Spectroscopy and Related Phenomena

Materials ScienceMaterials EngineeringAisi 304EngineeringNative Oxide LayersCorrosionCommercial Stainless SteelsOxidation ResistanceOxide ElectronicsApplied PhysicsSurface AnalysisMicrostructure

References

	Year	Citations

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