Publication | Open Access
Radiation hardness of GaAs: Cr and Si sensors irradiated by electron beam
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Citations
12
References
2020
Year
SemiconductorsSi SensorsElectrical EngineeringSemiconductor TechnologyEngineeringRadiation DetectionElectron BeamRadiation HardnessIon ImplantationApplied PhysicsPhotoelectric MeasurementInstrumentation
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