Publication | Closed Access

Intensive comparative study using X-Ray diffraction for investigating microstructural parameters and crystal defects of the novel nanostructural ZnGa2S4 thin films

Materials ScienceMaterial AnalysisEngineeringIntensive Comparative StudyCrystalline DefectsNanotechnologyCrystal Growth TechnologyX-ray DiffractionApplied PhysicsOxide ElectronicsDefect FormationMicrostructural ParametersThin FilmsCrystallographyThin Film ProcessingMicrostructure