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Large-Scale characterization of Two-Dimensional Monolayer MoS2 Island Domains Using Spectroscopic Ellipsometry and Reflectometry

Ii-vi SemiconductorSurface CharacterizationTransition Metal ChalcogenidesLarge-scale CharacterizationEngineeringPhysicsSurface ScienceApplied PhysicsCondensed Matter PhysicsQuantum MaterialsLayered MaterialTopological Heterostructures