Publication | Closed Access
Investigation of electrical and capacitance- voltage characteristics of GO/TiO2/n-Si MOS device
28
Citations
63
References
2020
Year
Materials ScienceElectrical EngineeringEngineeringNanoelectronicsApplied PhysicsCapacitance- Voltage CharacteristicsSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsSemiconductor DeviceGo/tio2/n-si Mos Device
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