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Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement

DOIFull Paper Access

149

Citations

35

References

2020

Year

Karen Sugden, Eilís Hannon, Louise Arseneault, Daniel W. Belsky, David L. Corcoran, Helen L. Fisher, Renate Houts, Radhika Kandaswamy, Terrie E. Moffitt, Richie Poulton,
Patterns

References

YearCitations

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