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Determination of trace elements in high-purity quartz samples by ICP-OES and ICP-MS: A normal-pressure digestion pretreatment method for eliminating unfavorable substrate Si

Molecular SieveExtractive MetallurgyChemical EngineeringHigh-purity Quartz SamplesEngineeringTrace Element GeochemistryMass SpectrometryAnalytical ChemistryGeochemistryChemistryInstrumentationUnfavorable Substrate SiMineral ProcessingElemental CharacterizationTrace ElementTrace Elements