Review on applications of synchrotron‐based X‐ray techniques in materials characterization

Abstract

Synchrotron radiation (SR), as a result of its high‐intensity, brilliant, monochromatic, and collimated beams, is becoming one of the most crucial components of research in various fields of materials science such as nanomaterials, biomaterials, and energy materials. SR‐based characterization methods can be employed to analyze different systems such as powders, thin films, and bulk forms having complex crystalline or amorphous structures. In this review, peculiarities of SR are briefly explained. Moreover, various techniques carried out utilizing this instrument for material characterization such as X‐ray powder diffraction, grazing‐incidence X‐ray diffraction, small/wide‐angle X‐ray scattering, X‐ray absorption spectroscopy, different techniques of X‐ray imaging, X‐ray photoelectron spectroscopy, and X‐ray microprobes/nanoprobes are presented. As a result, by shedding light on the advantages of SR and its superiority to the equivalent laboratory experiments, researchers are recommended to exploit the capabilities of this invaluable tool in their materials characterization.