Sensitive Direct Converting X‐Ray Detectors Utilizing Crystalline CsPbBr₃ Perovskite Films Fabricated via Scalable Melt Processing

Abstract

Abstract Here the fabrication of an inorganic metal‐halide perovskite CsPbBr 3 based X‐ray detector is reported utilizing a simple, scalable, and cost‐sensitive melt processing directly on substrate of any size. X‐ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm 2 range. The CsPbBr 3 film features a resistance of 8.5 GΩ cm and a hole mobility of 18 cm 2 V −1 s −1 . An X‐ray to current conversion rate of 1450 µC Gy air −1 cm −2 at an electric field of 1.2 × 10 4 V cm −1 and a detection limit in the sub µ Gy air s −1 regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr 3 films are suggested to be responsible for a performance which is on par to current state‐of‐the‐art Cd(Zn)Te based X‐ray detector technology.