Impact of stress effect on triple material gate step-FinFET with DC and AC analysis

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Yee‐Chia Yeo, Tsu-Jae King, Chenming Hu · IEEE Transactions on Electron Devices · 2003 · 232 citations

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Fermi-Level Pinning at the Polysilicon/Metal Oxide Interface—Part I

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Sub-20 nm CMOS FinFET technologies

Yang‐Kyu Choi, N. Lindert, Peiqi Xuan et al. · 2002 · 194 citations

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