Publication | Closed Access
Impact of stress effect on triple material gate step-FinFET with DC and AC analysis
14
Citations
27
References
2019
Year
Device ModelingElectrical EngineeringAc AnalysisEngineeringNanoelectronicsElectronic EngineeringBias Temperature InstabilityStress EffectElectronic PackagingMicroelectronicsSemiconductor Device
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