Photovoltaic defect classification through thermal infrared imaging using a machine learning approach

Christopher Dunderdale, Warren Brettenny, E.E. van Dyk

Progress in Photovoltaics Research and Applications · 2019 · 142 citations · 17 references

Concepts

Abstract

Abstract This study examines a deep learning and feature‐based approach for the purpose of detecting and classifying defective photovoltaic modules using thermal infrared images in a South African setting. The VGG‐16 and MobileNet models are shown to provide good performance for the classification of defects. The scale invariant feature transform (SIFT) descriptor, combined with a random forest classifier, is used to identify defective photovoltaic modules. The implementation of this approach has potential for cost reduction in defect classification over current methods.

References

17