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Safe limits for the application of nonlinear optical microscopies to cultural heritage: A new method for in-situ assessment

Optical MaterialsSafe LimitsEngineeringMicroscopyOptical PropertiesOptical TestingCultural HeritageApplied PhysicsNonlinear Optical MicroscopiesOptical Information ProcessingOptical SystemsOptical EngineeringOptical System AnalysisOptical Imaging