IEEE Access · 2019 · 116 citations · 24 references
ComputingComputer SciencePlant SciencesComputer VisionFeature EngineeringMachine LearningDeep LearningImage ClassificationMetric LearningClassification AccuracyDeep Learning-based ClassificationFew-shot ClassificationFew-shot Image ClassificationFew-shot LearningFew-shot Metric LearningNearest-neighbor ClassificationSiamese Networks
In recent years, the method of plant leaf classification by deep learning has gradually become mature. However, training a leaf classifier based on deep learning requires a large number of samples for supervised training. In this paper, a few-shot learning method based on the Siamese network framework is proposed to solve a leaf classification problem with a small sample size. First, the features of two different images are extracted by a parallel two-way convolutional neural network with weight sharing. Then, the network uses a loss function to learn the metric space, in which similar leaf samples are close to each other and different leaf samples are far away from each other. In addition, a spatial structure optimizer (SSO) method for constructing the metric space is proposed, which will help to improve the accuracy of leaf classification. Finally, a k-nearest neighbor (kNN) classifier is used to classify leaves in the learned metric space. The average classification accuracy is used as a performance measure. The open access Flavia, Swedish and Leafsnap datasets are used to evaluate the performance of the method. The experimental results show that the proposed method can achieve a high classification accuracy with a small size of supervised samples.
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Hoo-Chang Shin, Holger R. Roth, Mingchen Gao et al. · IEEE Transactions on Medical Imaging · 2016 · 5.8K citations · Full text
Prototypical Networks for Few-shot Learning
Jake Snell, Kevin Swersky, Richard S. Zemel · arXiv (Cornell University) · 2017 · 5.2K citations · Full text