Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction - Concepedia

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Publication | Open Access

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

DOI Full Paper Access

22

Citations

18

References

2019

Year

Christopher Addiego, Wenpei Gao, Xiaoqing Pan

Ultramicroscopy

Materials ScienceEngineeringElectron MicroscopyPhysicsApplied PhysicsCondensed Matter PhysicsInter-atomic Electric FieldsAtomic PhysicsMicroanalysisElectron DiffractionThin FilmsDefocus DependenceElectrical Property

References

	Year	Citations

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