Publication | Closed Access
Experimental and ab-initio investigation of the microstructure and optoelectronic properties of FCM–CVD-prepared Al-doped ZnO thin films
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Citations
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References
2019
Year
Materials ScienceMaterial AnalysisEngineeringOptoelectronic PropertiesOxide ElectronicsOptoelectronic MaterialsApplied PhysicsOptoelectronic DevicesAb-initio InvestigationThin Film Process TechnologyThin FilmsThin Film Processing
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