Marginal and internal fit of CAD/CAM frameworks in multiple implant‐supported restorations: Scanning and milling error analysis

Abstract

Horizontal plane scanning errors are greater than vertical errors. Scanning angulation/milling errors are higher for suprastructures>3implants. Scanning/milling errors are associated with ID/MD, respectively, leading to micro-gap formation. A CMM reduces scanning errors in >3-implant-frameworks before milling the final piece.