Applied Physics Letters · 2019 · 13 citations · 29 references
EngineeringMaterials EngineeringMaterials ScienceCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsCompound SemiconductorsIii-v SemiconductorsOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor LasersSemiconductor PhysicsBand GapGallium NitrideGallium Nitride (Gan) MaterialsMolecular Beam EpitaxyTemperature DependenceThermal StabilityValence BandValence Band Structure
GaNAs layers with a low As concentration (As ≤ 0.6%) have been grown by molecular beam epitaxy and studied by structural and optical methods. It has been observed that the incorporation of a small amount of As atoms into the GaN host leads to a significant reduction of the bandgap due to the formation of an As-related band above the valence band of the GaN host. The position of this band does not change with temperature, and therefore, a reduced temperature dependence of the bandgap is observed for As-diluted GaN compared to the pure GaN host, which is ∼40 meV vs ∼70 meV in the 10–295 K temperature range. The observed effect is explained within the band anticrossing model. It is expected that the reduced temperature dependence of the bandgap in As-diluted GaN can be utilized in lasers with improved thermal stability.
29
Band parameters for nitrogen-containing semiconductors
I. Vurgaftman, J. R. Meyer · Journal of Applied Physics · 2003 · 2.7K citations
Band Anticrossing in GaInNAs Alloys
W. Walukiewicz, Joel W. Ager, E. E. Haller et al. · Physical Review Letters · 1999 · 1.6K citations
Bowing parameter of the band-gap energy of GaNxAs1−x
Wengang Bi, C. W. Tu · Applied Physics Letters · 1997 · 403 citations