Quantitative analysis of elemental depth on Wendelstein 7-X divertor baffle screws by picosecond laser-induced breakdown spectroscopy - Concepedia

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Quantitative analysis of elemental depth on Wendelstein 7-X divertor baffle screws by picosecond laser-induced breakdown spectroscopy

25

Citations

26

References

2019

Year

Cong Li, J. Oelmann, S. Brezinsek, M. Rasiński, C. P. Dhard, R. König, Y. Liang, Hongbin Ding, Ch. Linsmeier

Spectrochimica Acta Part B Atomic Spectroscopy

Elemental DepthPhysicsLaser-induced BreakdownApplied PhysicsQuantitative Analysis

References

	Year	Citations

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