Publication | Open Access
Intrinsic Optoelectronic Characteristics of MoS<sub>2</sub> Phototransistors <i>via</i> a Fully Transparent van der Waals Heterostructure
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Citations
39
References
2019
Year
In the past decade, intensive studies on monolayer MoS<sub>2</sub>-based phototransistors have been carried out to achieve further enhanced optoelectronic characteristics. However, the intrinsic optoelectronic characteristics of monolayer MoS<sub>2</sub> have still not been explored until now because of unintended interferences, such as multiple reflections of incident light originating from commonly used opaque substrates. This leads to overestimated photoresponsive characteristics inevitably due to the enhanced photogating and photoconductive effects. Here, we reveal the intrinsic photoresponsive characteristics of monolayer MoS<sub>2</sub>, including its internal responsivity and quantum efficiency, in fully transparent monolayer MoS<sub>2</sub> phototransistors employing a van der Waals heterostructure. Interestingly, as opposed to the previous reports, the internal photoresponsive characteristics do not significantly depend on the wavelength of the incident light as long as the electron-hole pairs are generated in the same <i>k</i>-space. This study provides a deeper understanding of the photoresponsive characteristics of MoS<sub>2</sub> and lays the foundation for two-dimensional materials-based transparent phototransistors.
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