Optical switching of defect charge states in 4H-SiC

Abstract

We demonstrate optically induced switching between bright and dark charged divacancy defects in 4H-SiC. Photoluminescence excitation and time-resolved photoluminescence measurements reveal the excitation conditions for such charge conversion. For an energy below 1.3 eV (above 950 nm), the PL is suppressed by more than two orders of magnitude. The PL is recovered in the presence of a higher energy repump laser with a time-averaged intensity less than 0.1% that of the excitation field. Under a repump of 2.33 eV (532 nm), the PL increases rapidly, with a time constant 30 μs. By contrast, when the repump is switched off, the PL decreases first within 100-200 μs, followed by a much slower decay of a few seconds. We attribute these effect to the conversion between two different charge states. Under an excitation at energy levels below 1.3 eV, V_SiV_C⁰ are converted into a dark charge state. A repump laser with an energy above 1.3 eV can excite this charged state and recover the bright neutral state. This optically induced charge switching can lead to charge-state fluctuations but can be exploited for long-term data storage or nuclear-spin-based quantum memory.