Investigation of annealing effects on the physical properties of Ni_0.6Zn_0.4Fe_1.5Al_0.5O₄ ferrite

Abstract

' decreased rapidly with frequency. This sample exhibited the lowest defect density than the other samples. Consequently, its electrical conductivity increased. A Nyquist diagram was used to examine the contribution of the grains and grain boundary to conduction and to model each sample by an equivalent electrical circuit. The dielectric behavior of the investigated samples was correlated to the polarization effect.