Development of Tracking Detectors With Industrially Produced GEM Foils

Abstract

<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> The planned tracking upgrade of the STAR experiment at RHIC includes a large-area GEM tracker used to determine the charge sign of electrons and positrons produced from W<formula formulatype="inline"><tex>$^{+(-)}$</tex> </formula> decays. For such a large-scale project commercial availability of GEM foils is necessary. We report first results obtained with a triple GEM detector using GEM foils produced by Tech-Etch Inc. of Plymouth, MA. Measurements of gain uniformity, long-term stability as well as measurements of the energy resolution for X-Rays are compared to results obtained with an identical detector using GEM foils produced at CERN. A quality assurance procedure based on optical tests using an automated high-resolution scanner has been established, allowing a study of the correlation of the observed behavior of the detector and the geometrical properties of the GEM foils. Detectors based on Tech-Etch and CERN produced foils both show good uniformity of the gain over the active area and stable gain after an initial charge-up period, making them well suited for precision tracking applications. </para>