RSC Advances · 2019 · 45 citations · 62 references
Intrinsic Bi<sub>2</sub>Te<sub>3</sub> is a representative thermoelectric (TE) material with high performance at low temperature, which enables applications for electronic cooling. However, antisite defects easily form in p-type Bi<sub>2</sub>Te<sub>3</sub>, resulting in the difficulty of further property enhancement. In this work, the formation energy of native point defects in Bi<sub>2</sub>Te<sub>3</sub> supercells and the electronic structure of Bi<sub>2</sub>Te<sub>3</sub> primitive unit cell were calculated using first-principles. The antisite defect Bi_Te<sub>1</sub> has a lower formation energy (0.68 eV) under the Te-lack condition for p-type Bi<sub>2</sub>Te<sub>3</sub>. The effects of point defects on TE properties were investigated <i>via</i> a series of p-type Bi<sub>2</sub>Te<sub>3-<i>x</i></sub> (<i>x</i> = 0, 0.02, 0.04, 0.06, 0.08) single crystals prepared by the temperature gradient growth method (TGGM). Apart from the increased power factor (PF<sub>∥</sub>) which originates from the increased carrier concentration (<i>n</i> <sub>∥</sub>) and <i>m</i>*, the thermal conductivity (<i>κ</i> <sub>∥</sub>) was also cut down by the increased point defects. Benefitting from the high PF<sub>∥</sub> of 4.09 mW m<sup>-1</sup> K<sup>-2</sup> and the low <i>κ</i> <sub>∥</sub> of 1.77 W m<sup>-1</sup> K<sup>-1</sup>, the highest <i>ZT</i> <sub>∥</sub> of 0.70 was obtained for <i>x</i> = 0.06 composition at 300 K, which is 30% higher than that (0.54) of the intrinsic Bi<sub>2</sub>Te<sub>3</sub>.
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