Publication | Open Access

A new FE post-processor for probabilistic fatigue assessment in the presence of defects and its application to AM parts

ReliabilityElectrical EngineeringCondition MonitoringReliability EngineeringEngineeringNew Fe Post-processorHardware ReliabilityMechanical EngineeringStructural Health MonitoringComputer EngineeringProbabilistic Fatigue AssessmentCircuit ReliabilityStructural MechanicsLow-cycle FatigueAm PartsPhysic Of Failure