Publication | Closed Access
Effects of ion irradiation on the structural and electrical properties of HfO2/SiON/Si p-metal oxide semiconductor capacitors
10
Citations
38
References
2019
Year
Materials ScienceElectrical EngineeringIon ImplantationEngineeringNanoelectronicsOxide ElectronicsApplied PhysicsSilicon On InsulatorMicroelectronicsElectrical PropertiesIon IrradiationSemiconductor Device
| Year | Citations | |
|---|---|---|
Page 1
Page 1