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A Reconfigurable Transient Optimizer Applied to a Four-Phase Buck Converter for Optimizing Both DVS and Load Transient Responses
17
Citations
11
References
2019
Year
EngineeringEnergy EfficiencyPower Optimization (Eda)Power Electronics ConverterElectric Power ConversionPower Electronic SystemsPower ElectronicsOptimizing Both DvsLoad Transient ResponsesLoad TransientsSystems EngineeringPower System TransientPower SystemsElectrical EngineeringComputer EngineeringDvs TransientLoad TransientEnergy ManagementFour-phase Buck ConverterPower Inverter
This brief presents a reconfigurable transient optimizer (RTO) applied to a four-phase buck converter for optimizing both dynamic-voltage-scaling (DVS) and load transient responses to approach the theoretically minimum output-voltage undershootΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">US</sub> , overshoot ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OS</sub> , and settling time tS. The DVS and load transients are instantly detected by a voltage sensor and calibrated capacitor-current sensor, respectively. When a large DVS or load transient occurs, the RTO enables all four phases, reconfigures its circuit architecture, and controls the optimal ON-OFF times of the power switches, thereby settling the output voltage in a single ON-OFF switching with ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">US</sub> , ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OS</sub> , and tS close to their respective theoretical minima. The converter is fabricated in a 0.18-μm CMOS process with a 2.3-mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> chip area. For a 1-to-1.8 V (1.8-to-1 V) DVS transient, the measured ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OS</sub> (ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">US</sub> ) is not observable, while the measured tS is 182 ns (192 ns). For a 1.8-A step-up (step-down) load transient, the measured ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">US</sub> (ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OS</sub> ) and tS are 56 mV (45 mV) and 85 ns (76 ns), respectively. Compared with other state-of-the-arts, this brief's tS in the DVS transient response is the closest to its theoretical minimum, while the ratios of ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">US</sub> , ΔV <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">OS</sub> , and tS to their respective theoretical minima in the load transient response are comparable.
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