Crystallographic orientation dependence of nanoindentation hardness in austenitic phase of stainless steel

Abstract

This paper presents the indentation hardness evolution in different in-plane directions of austenite grains whose {111} planes are parallel to the sample surface determined by nanoindentation tests and electron back scattering diffraction (EBSD) analysis. A scanning electron microscopy (SEM) image of the indentation surface around one of the indents indicated the activation of two sets of slip planes with respect to each of the three indenter surfaces for a Berkovich tip. The identification of the slip traces by EBSD data analysis is in accord with Schmid`s law. We therefore proposed a new approach for defining the orientation parameter to interpret the indentation hardness. The orientation parameter was shown to be the minimum value of the three maximum Schmid factors on the secondarily activated slip planes in three directions for a Berkovich tip. Indentation hardness increased with the decrease in the orientation parameter and was dependent on in-plane orientation.