Micron · 2019 · 22 citations · 50 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureElectronic MaterialsOpticsCrystal ChemistryCrystallographyElectron MicroscopyOrganic Electronic MaterialsOrganic SemiconductorsTransmission Electron MicroscopyLattice Fringe AnalysisOrganic CrystalsScanning Electron MicroscopyScanning Electron Microscopy AnalysisScanning Transmission Electron Microscopy
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David L. Donoho · IEEE Transactions on Information Theory · 2006 · 23.1K citations
Sub-ångstrom resolution using aberration corrected electron optics
Philip E. Batson, Niklas Dellby, Ondrej L. Krivanek · Nature · 2002 · 899 citations