2018 · 16 citations · 4 references
EngineeringElectrical EngineeringMicroelectronicsPhotonicsSensorsDetector TechnologyImage SensorsCmos Image SensorsComplementary Metal-oxide-semiconductor Image SensorsDark CurrentFull-well CapacityGlobal ShutterImage Sensor TechnologyPixel ArchitectureSaturation
A <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$3208\times 2184$</tex> global shutter image sensor with back-illuminated architecture is implemented in a 90 nm/65 nm imaging process. The sensor, having <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$2.74\ \mu \mathrm{m}$</tex> -pitch-pixels, achieves 10000 electrons full-well capacity and −80 dB parasitic light sensitivity. Furthermore, 13.8 e-/s dark current at 60°C and 1.85 erms random noise are obtained. In this paper, the structure of a pixel with memory along with saturation enhancement technology is described.
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Masahiro Kobayashi, Yusuke Onuki, Kazunari Kawabata et al. · IEEE Journal of Solid-State Circuits · 2017 · 24 citations