In-doped As2Se3 thin films studied by Raman and X-ray photoelectron spectroscopies

Yu. M. Azhniuk, Dmytro Solonenko, Vasyl Loya, Iaroslav Grytsyshche, V. V. Lopushansky, A. V. Gomonnai, Dietrich R. T. Zahn

Applied Surface Science · 2018 · 20 citations · 34 references

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