Characterization of 1.2 kV SiC Power MOSFETs at Cryogenic Temperatures

Abstract

To operate a converter at cryogenic temperatures, understanding the characteristics of power semiconductor devices is critical. This paper presents the characterization of state-of-the-art 1.2 kV SiC MOSFETs from leading manufacturers at cryogenic temperatures. The testing setup consisting of a cryogenic chamber, and a liquid nitrogen Dewar is introduced. With a curve tracer and double pulse test, comprehensive characterization of the SiC MOSFETs including both static and switching performance is conducted and evaluated. Test results indicate the on-resistance increases while the breakdown voltage remains relatively constant at cryogenic temperatures. Other characteristics like threshold voltage and switching loss vary significantly at cryogenic temperatures among devices from different manufacturers.