Publication | Closed Access

Critical impact of gate dielectric interfaces on the trap states and cumulative charge of high-performance organic thin field transistors

Device ModelingElectrical EngineeringEngineeringOrganic ElectronicsNanoelectronicsApplied PhysicsOrganic SemiconductorCumulative ChargeCharge Carrier TransportGate Dielectric InterfacesCritical ImpactSemiconductor Device